元素分析仪厂价直销光谱仪金属元素分析仪 有色金属检测仪

应用领域：                   合金成分分析（铜合金不锈钢等)

                  合良好号判定

                  RoHS、卤素环保指令检测

                                       镀层厚度测试

技术参数:

Specifications

                                       1.分析范围:硫（S）－铀（U）

                                         Measurable elements：S-U

                                       2.含量范围:2ppm-99.99％

                                           Element content:2ppm-99.99％

                                       3.测量时间:50-300秒(可调)

                                           Measurement time 50-300s（adjustable）

                                       4.能量分辨率:149±5eV

                                          Resolution:149±5eV

                                       5.高压电源功率:50W

                                          High voltage power supply power：50W

                                       6.样品腔尺寸:610mm ×320mm×100mm

                                           Sample chamber size :610mm ×320mm×100mm

产品特点：

Product Features

1.采用美国原装电致冷高性能Si-PIN探测器，分辨率高，探测范围宽,涵盖RoHS、卤素、镀层、合金(含贵金属)及各种常规材料分析的基本要求。

Using the original refrigeration high-performance Si-PIN detector, high resolution, wide detection range and covers the RoHS,halogen, plating, alloy (including precious metals) and basic requirements of various kinds of conventional material analysis.

2.配置DPP数字多道信号集成处理器，比普通模拟多道信号处理器性能更佳，尤其在高计数率时有更好的分辨力(如Hg和Cl等)，高达80MHz的数据传输速度使分析时间更短，测量重复性和长期稳定性更好。

Configuring the international most advanced DPP with digital integrated multichannel ** processor. Multi-channel ** processor performance is better than the general simulation, especially in the high count rate has better resolution (such as Hg and Cl). The speed of the data transmission up to 80 MHZ make the analysis time shorter, repeatability better and long-term stability.

3.内置高清摄像系统，清晰观察样品，准确定位样品测试区域。

Built-in high-definition camera system, observe the sample clearly and locate sample test area accurately.

4.配套较新的FP测量软件，集成多种谱图处理算法和基体校正算法，有效降低仪器测量中的各种干扰谱峰，使低含量和痕量元素的检测结果更加准确，更加接近真值水平。

Configuringthe latest FP measuring software, integrate variety of spectrogram processing algorithm and matrix correction algorithm, can reduce the various interference spectrum peak in the instrument measuring effectively, to make low content and trace elements test results more accurate, more close to the true value

技术参数: